Document Details

Document Type : Article In Journal 
Document Title :
Optical Characterizations of CdS Thin Films Grown by Pulsed Laser Deposition Technique
Optical Characterizations of CdS Thin Films Grown by Pulsed Laser Deposition Technique
 
Subject : physics 
Document Language : English 
Abstract : Cadmium Sulphide (CdS) thin films were prepared by pulsed laser deposition technique under high vacuum. The structural characteristics were investigated by X-ray diffraction. The X-ray analysis revealed that the deposited CdS films are crystalline and have preferred orientation on a plane (110) of an hexagonal system. Optical constants (n and k) were estimated using spectrophotometric measurements of transmittance and reflectance at normal incidence of light. The optical band gap energy was found to be 2.44 eV with direct allowed transitions. Some dispersion parameters are calculated namely; single oscillator energy, dispersion energy, lattice dielectric constant and high frequency dielectric constant 
ISSN : 1555-130X 
Journal Name : JOURNAL OF NANOELECTRONICS AND OPTOELECTRONICS 
Volume : 9 
Issue Number : 5 
Publishing Year : 1435 AH
2014 AD 
Article Type : Article 
Added Date : Thursday, July 27, 2017 

Researchers

Researcher Name (Arabic)Researcher Name (English)Researcher TypeDr GradeEmail
A.A HendiHendi, A.A InvestigatorDoctorate 

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